INSIGHT Ironware Application Plant

The content of quality inspection of different coating products varies depending on the part and coating, but the appearance, thickness, corrosion resistance and bonding force with the base metal of the coating must be checked for all coatings, and the thickness of the coating is the quality of the coating. Among them, the thickness of the coating is the most important guarantee factor for the quality of the plated parts. Aiming at the detection and screening problems in the process control of surface treatment, product quality inspection and other links in the ironware application, LANScientific provides you with an efficient and intelligent XRF analysis instrument –  INSIGHT, INSIGHT coating analyzer is a up-bottom coating analyzer with high sensitivity, non-destructive, simple operation, high test accuracy, compact appearance, space saving, etc. It can not only be used for elemental analysis of samples with uneven, irregular, and even small shapes, but also for thickness measurement of coatings and coating systems.，It is widely used in quality control, incoming material inspection and production process control of various products to help customers reduce material costs and meet corresponding industrial standards.

Multi-collimator

One-touch measurement

The instrument is equipped with intuitive and intelligent analysis software, which is easy to operate. Anyone can test samples without training. Just click “Start Test”, and the test results can be obtained in tens of seconds.

Nondestructive testing

X-ray fluorescence is a non-destructive analytical process that leaves no traces and it is very safe to measure even on sensitive materials.

High-performance imported detector

We choose Si-PIN detectors suitable for multi-element coatings. Compared with traditional gas proportional counters, Si-PIN has better resolution, lower background noise (highest S/N ratio) long-term stability and longer service life.

High-precision manual X-Y platform

It is equipped with a high-precision manual X-Y platform with a maximum accuracy of 25μm, making micro-area measurement more convenient.

The characteristics of	Top-down measurement structure, XYZ measurement platform, MUTI-FP multilayer algorithm
Scope of element	Na(11)—Fm(100)
Analysis of the layer number of	5 layers (4 layers + substrate) each layer can analyze 10 elements, composition analysis can analyze up to 25 elements
X-ray tube	50 W (50 kV, 1mA) micro-focused tungsten palladium ray tube (target material is optional)
The detector	Si-PIN large area detector
Collimator	φ0.5-φ5  is optional. Multi-standard is optional
The camera	High resolution CMOS color camera, 5 megapixels
magnification	40x-160x
Manual sample XY platform	Moving range：100 x 150 mm
Programmable XY platform	(Optional)
Z-axis range of movement	150 mm
Sample bin size	520 x 480 x 170 mm(L x W x H)
Overall dimensions	624 x 702 x 730 mm(L x W x H)
weight	120KG
The power supply	AC 220V±5V 50Hz(The configuration varies slightly by region)
Rated power	150W